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+/*
+ Copyright (C) 2006 Yangli Hector Yee
+ Copyright (C) 2006 Red Hat, Inc.
+
+ This program is free software; you can redistribute it and/or modify it under the terms of the
+ GNU General Public License as published by the Free Software Foundation; either version 2 of the License,
+ or (at your option) any later version.
+
+ This program is distributed in the hope that it will be useful, but WITHOUT ANY WARRANTY;
+ without even the implied warranty of MERCHANTABILITY or FITNESS FOR A PARTICULAR PURPOSE.
+ See the GNU General Public License for more details.
+
+ You should have received a copy of the GNU General Public License along with this program;
+ if not, write to the Free Software Foundation, Inc., 51 Franklin Street, Suite 500, Boston, MA 02110-1335, USA
+*/
+
+#ifndef _PDIFF_H
+#define _PDIFF_H
+
+#include <cairo.h>
+
+typedef int bool;
+#ifndef true
+#define true 1
+#endif
+#ifndef false
+#define false 0
+#endif
+
+/* Image comparison metric using Yee's method (and a cairo interface)
+ * References: A Perceptual Metric for Production Testing, Hector Yee, Journal of Graphics Tools 2004
+ */
+int
+pdiff_compare (cairo_surface_t *surface_a,
+ cairo_surface_t *surface_b,
+ double gamma,
+ double luminance,
+ double field_of_view);
+
+#endif